Bartl, Guido and Elster, Clemens and Martin, Jörg and Schödel, René and Voigt, Michael and Walkov, Alexander (2020) Thermal expansion and compressibility of single-crystal silicon between 285 K and 320 K. Measurement Science and Technology, 31 (6). 065013. ISSN 0957-0233
Bartl_2020_Meas._Sci._Technol._31_065013.pdf - Published Version
Download (2MB)
Abstract
The absolute length of a single-crystal silicon gauge block was measured by interferometry in the temperature range between 285 K and 320 K and at different air pressures from atmospheric conditions down to 10−5 hPa. From the obtained dataset, the coefficient of thermal expansion (CTE) was determined as well as the compressibility—or the bulk modulus—of single-crystal silicon in consideration of a systematic correction of the refractometer used. As the choice of the underlying model for the evaluation is not unambiguous, a Bayesian model averaging approach was applied to take into account possible model errors in the uncertainty evaluation. The result of the CTE is not only in agreement with the recommended reference data of CODATA, but provides a standard uncertainty of less than 1 × 10−9 K−1, which is less than half the uncertainty stated so far in the relevant temperature range.
Item Type: | Article |
---|---|
Subjects: | Universal Eprints > Computer Science |
Depositing User: | Managing Editor |
Date Deposited: | 13 Jul 2023 03:55 |
Last Modified: | 14 Oct 2023 03:48 |
URI: | http://journal.article2publish.com/id/eprint/2292 |