STUDY OF THE THICKNESS EFFECT ON THE STRUCTURAL AND OPTICAL PROPERTIES OF ZnO THIN FILMS PREPARED BY THERMAL EVAPORATION TECHNIQUE

Using the thermal evaporation technique we prepared Zinc Oxide thin films (ZnO) with different thicknesses. Crystallinity and optical characterization of the films were studied by XRD and UV-VIS techniques, respectively. The (Zn) powder material was evaporated on the unheated laboratory glass slides then thermal oxidation was performed at temperature 400°C for 1 h. The effect of film thickness on the structural and optical properties of the ZnO films has been done. All the films had a well-defined crystal structure with hexagonal wurtize and the preferred orientation along (002) plane. Optical properties such as transmission, absorption and optical band gap were measured and calculated.